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GEB Enterprise

GEB Enterprise

BSPIO-LVDS39

Digital Modules for Boundary Scan I/O Access

JTAG LVDS I/O parallel module

Features:

  • 39 LVDS I/O channels for interface logic drive and sense
  • High reliability DIN41612 I/O connector
  • Reliable screw lock brackets
  • Size  122mm X 70mm
  • 96 bit Boundary-scan Register Length
  • Each segment can be independently bypassed 
  • Medium-speed 10MHz TCK for high reliability at the best cost/performance ratio
  • Each LVDS I/O pin is independently programmable for sense, drive, bi-directional, and tri-state operation
  • Fully-compatible JTAG/IEEE 1149.1 Test Access Port (TAP)
  • Optional LVDS TCK interface can be used in large fixtures to avoid noise and skew problems.
  • Full self test capability using internal loopback.

General Description

The BSPIO-LVDS39 provides bi-directional parallel-scan access to up to 39 electrical nodes with LVDS interfaces for the driving and sensing of logic values. This module increases the effectiveness of boundary-scan testing, enabling verification of all board connectors and within logic clusters. The BSPIO-LVDS39 is available in two basic versions,  both  of them compatible with the standard DIN41612 female connectors in a test fixture. One version, the BSPIO-LVDS39-A1, is primarily intended for test fixtures with few BSPIOsand contains a standard TTL interface on the TAP’s TCK signal. This module facilitates boundary-scan interconnection testing using direct connection to the JTAG/IEEE 1149.1 Test Access Port (TAP).
The other version, the BSPIO-LVDS39-A2, is intended for test fixtures with many BSPIOs and contains a balanced LVDS interface on the TAP’s TCK signal. This module facilitates boundary-scan interconnection testing using a small interface connection to a JTAG/IEEE 1149.1 TAP. Other low-end versions (ex: 19 channel LVDS) are derived from these two basic models. All BSPIO I/O interfaces have an internal loopback for self test capability.